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| RN1101RN1106 TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) RN1101, RN1102, RN1103, RN1104, RN1105, RN1106 Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications With built-in bias resistors Simplified circuit design Reduced number of parts and simplified manufacturing process Complementary to RN2101~ RN2106 Unit: mm Equivalent Circuit and Bias Resister Values Type No. RN1101 RN1102 RN1103 RN1104 RN1105 RN1106 R1 (k) 4.7 10 22 47 2.2 4.7 R2 (k) 4.7 10 22 47 47 47 Absolute Maximum Ratings (Ta = 25C) Characteristic Collector-base voltage Collector-emitter voltage Emitter-base voltage Collector current Collector power dissipation Junction temperature Storage temperature range RN1101~1106 RN1101~1106 RN1101~1104 RN1105, 1106 Symbol VCBO VCEO VEBO IC PC Tj Tstg Rating 50 50 10 5 100 100 150 -55~150 JEDEC EIAJ TOSHIBA Weight: 2.4 mg Unit V V V mA mW C C 2-2H1A Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 1 2007-11-01 RN1101RN1106 Electrical Characteristics (Ta = 25C) Characteristic Collector cut-off current RN1101~1106 RN1101 RN1102 Emitter cut-off current RN1103 RN1104 RN1105 RN1106 RN1101 RN1102 DC current gain RN1103 RN1104 RN1105 RN1106 Collector-emitter saturation voltage RN1101~1106 RN1101 RN1102 Input voltage (ON) RN1103 RN1104 RN1105 RN1106 Input voltage (OFF) Transition frequency Collector output capacitance RN1101~1104 RN1105, 1106 RN1101~1106 RN1101~1106 RN1101 RN1102 Input resistor RN1103 RN1104 RN1105 RN1106 RN1101~1104 Resistor ratio RN1105 RN1106 R1/R2 R1 VI (OFF) fT Cob VCE = 5 V, IC = 0.1 mA VCE = 10 V, IC = 5 mA VCB = 10 V, IE = 0, f = 1 MHz VI (ON) VCE = 0.2 V, IC = 5 mA VCE (sat) IC = 5 mA, IB = 0.25 mA hFE VCE = 5 V, IC = 10 mA IEBO VEB = 10 V, IC = 0 Symbol ICBO ICEO Test Circuit Test Condition VCB = 50 V, IE = 0 VCE = 50 V, IB = 0 Min 0.82 0.38 0.17 0.082 VEB = 5 V, IC = 0 0.078 0.074 30 50 70 80 80 80 1.1 1.2 1.3 1.5 0.6 0.7 1.0 0.5 3.29 7 15.4 32.9 1.54 3.29 0.9 0.0421 0.09 Typ. 0.1 250 3 4.7 10 22 47 2.2 4.7 1.0 0.0468 0.1 Max 100 500 1.52 0.71 0.33 0.15 0.145 0.138 0.3 2.0 2.4 3.0 5.0 1.1 1.3 1.5 0.8 6 6.11 13 28.6 61.1 2.86 6.11 1.1 0.0515 0.11 k V MHz pF V V mA Unit nA 2 2007-11-01 RN1101RN1106 RN1101 IC (mA) RN1102 COLLECTOR CURRENT RN1103 RN1104 RN1105 RN1106 3 2007-11-01 RN1101RN1106 RN1101 RN1102 RN1103 RN1104 RN1105 RN1106 4 2007-11-01 RN1101RN1106 RN1101 RN1102 RN1103 RN1104 RN1105 RN1106 5 2007-11-01 RN1101RN1106 RN1101 RN1102 RN1103 RN1104 RN1105 RN1106 6 2007-11-01 RN1101RN1106 Type Name Marking RN1101 RN1102 RN1103 N1104 RN1105 RN1106 7 2007-11-01 RN1101RN1106 RESTRICTIONS ON PRODUCT USE * The information contained herein is subject to change without notice. 20070701-EN GENERAL * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-11-01 |
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